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Semiconductor
Wafer Silicon crystal growing measurement System
Wafer Silicon crystal growing measurement System
The crystal of wafer made by seed from liquid silicon. At that time this system would measure of silicon crystal and control the RPM and pulling gap of Seed. Those things are support to make a good wafer which has good quality.
Specification
1. Inspection Items
- Neck, Shoulder, Body inspection and control
2. Specification
- Camera Resolution : 768 x 494 Pixels
- UV, IR/ND Filter
- PXI Slot Pc Based Type For Magnetic Field Noise (National Instrument Limited)
- Real time data Feed Back System
- Neck, Shoulder, Body inspection and control
2. Specification
- Camera Resolution : 768 x 494 Pixels
- UV, IR/ND Filter
- PXI Slot Pc Based Type For Magnetic Field Noise (National Instrument Limited)
- Real time data Feed Back System
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