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Machine Vision Equipment
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Semiconductor
Wafer Probe Card Inspection System
Wafer Probe Card Inspection System
This Machine is a machine vision system that checks for Wafer Probe Card for abnormalities. Precision Align System enables highly precise operation and high-level inspection
Specification
- Target : Wafer Probe Card
- Inspection Item : Good / NG
- Inspection Item : Good / NG
Machine Features
- Inspection on Wafer Probe Card for abnormalities
- Increase productivity by managing Wafer Probe
- Conduct a precision Align using area Camera and a high reliability inspection.
- Inspection for each type of DUT.
- 3D Scanning before Probe inspection
- Map processing using CAD data
- Increase productivity by managing Wafer Probe
- Conduct a precision Align using area Camera and a high reliability inspection.
- Inspection for each type of DUT.
- 3D Scanning before Probe inspection
- Map processing using CAD data
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